X-ray diffraction study of TiB2, W2B4, and CrB2 at high temperatures

Momozawa, Ai (Corresponding author); Telle, Rainer

Amsterdam [u.a.] : Elsevier Science (2018, 2019)
Journal Article

In: Vacuum : surface engineering, surface instrumentation & vacuum technology
Volume: 167
Page(s)/Article-Nr.: 577-585

Identifier